Highly‐integrated tester (mezzanine module) that mounts directly on an application or test board without requiring cables.

Data rates: 250 Mbps to 4 Gbps fully continuous operating range.

Lanes: 8 Tx and 8 Rx, independent, differential with per channel adjustment of voltage and timing.

Signal impairments: sinusoidal and random jitter, de‐emphasis, skew, and bit slip.

DUT TX Measurements: eye-diagram, EQ, analog waveform and jitter generation

Parallel: SV1 D tests all your lanes simultaneously – with increasing crosstalk issues, a truly parallel system allows for the most comprehensive “stress test” that is possible.

Self Contained: an all‐in‐one system reduces board space and helps create a compact tester‐on‐board for characterization tasks or production test.

Ease of integration: direct attachment with standard, low‐cost connectors. Single 12‐VDC power supply with internal regulation.

Applications include:

Parallel PHY validation of serial bus standards such as:
PCI Express (PCIe),HDMI, UHS-2, Thunderbolt, MIPI M-PHY, XAUI, CPRI, JESD204B, USB, SATA

Interface test of electrical/optical media such as:
Backplane, Cable, CFP MSA, SFP MSA, SFP+ MSA

Plug-and-play system-level validation such as:
PCI Express, DisplayPort sink/source, MIPI M-PHY

Name	SV1D-4
Description	SV1D-4 – 4 Gbps 8 channels. Direct Attach Module
Tx Channels	8
Rx Channels	8
Min Data Rate	250Mbps
Max Data Rate	4Gbps
Differential Voltage Output	20mV – 1000mVpp
Differential Voltage Input	25mV – 2000mV
Clock Outputs	2
Clock Inputs	1
Size	99 mm x 45 mm x 16 mm
User Programmable Pattern Memory	2Gbyte
Pattern Capability	Per channel PRBS polynomials 5-31, arbitrary user patterns, nested pattern sequencer loops
Built-in Jitter Injection	SJ, Bandlimited RJ, ISI, SSC
Equalization & Clock Recovery	CTLE, De-Emphasis, Analog CDR
I/O	SPI
Series	SV1D Series
Configurations	Mezzanine Module only

SV1D-4

SV1D-4

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